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| author | Dan Williams <dan.j.williams@intel.com> | 2018-09-26 10:47:15 -0700 |
|---|---|---|
| committer | Dan Williams <dan.j.williams@intel.com> | 2018-10-17 10:39:04 -0700 |
| commit | 0ead11181fe0c9538b185e46a494df21dc7de23a (patch) | |
| tree | 8c2caab7282e325da4e7c1b37faf27df5d540925 /tools/testing/nvdimm | |
| parent | 6f07f86c494074a0755930473f67cc8916654221 (diff) | |
| download | linux-0ead11181fe0c9538b185e46a494df21dc7de23a.tar.gz | |
acpi, nfit: Collect shutdown status
Some NVDIMMs, in addition to providing an indication of whether the previous shutdown was clean, also provide a running count of lifetime dirty-shutdown events for the device. In anticipation of this functionality appearing on more devices arrange for the nfit driver to retrieve / cache this data at DIMM discovery time, and export it via sysfs. Reviewed-by: Keith Busch <keith.busch@intel.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
Diffstat (limited to 'tools/testing/nvdimm')
| -rw-r--r-- | tools/testing/nvdimm/test/nfit.c | 1 | ||||
| -rw-r--r-- | tools/testing/nvdimm/test/nfit_test.h | 24 |
2 files changed, 1 insertions, 24 deletions
diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c index cffc2c5a778d..f1a2a1a7bb1b 100644 --- a/tools/testing/nvdimm/test/nfit.c +++ b/tools/testing/nvdimm/test/nfit.c @@ -24,6 +24,7 @@ #include <linux/list.h> #include <linux/slab.h> #include <nd-core.h> +#include <intel.h> #include <nfit.h> #include <nd.h> #include "nfit_test.h" diff --git a/tools/testing/nvdimm/test/nfit_test.h b/tools/testing/nvdimm/test/nfit_test.h index 33752e06ff8d..ade14fe3837e 100644 --- a/tools/testing/nvdimm/test/nfit_test.h +++ b/tools/testing/nvdimm/test/nfit_test.h @@ -117,30 +117,6 @@ struct nd_cmd_ars_err_inj_stat { #define ND_INTEL_SMART_INJECT_FATAL (1 << 2) #define ND_INTEL_SMART_INJECT_SHUTDOWN (1 << 3) -struct nd_intel_smart { - __u32 status; - union { - struct { - __u32 flags; - __u8 reserved0[4]; - __u8 health; - __u8 spares; - __u8 life_used; - __u8 alarm_flags; - __u16 media_temperature; - __u16 ctrl_temperature; - __u32 shutdown_count; - __u8 ait_status; - __u16 pmic_temperature; - __u8 reserved1[8]; - __u8 shutdown_state; - __u32 vendor_size; - __u8 vendor_data[92]; - } __packed; - __u8 data[128]; - }; -} __packed; - struct nd_intel_smart_threshold { __u32 status; union { |